TANGO

The award winning MATRIX-F II FT-NIR spectrometer allows the direct measurement in process reactors and pipelines, leading to a better understanding and control of the process. Accurate in-line results in seconds Multiple components per measurement Non-destructive analysis Optional built-in 6-port multiplexer Direct method transfer Rugged design Ethernet connectivity and industry standard communication protocols

The VERTEX FTIR research spectrometer productline is the culmination of everything Bruker has pioneered and developed in over 40 years. The VERTEX Series is built on a fully upgradeable optics platform that is designed with the utmost flexibility in mind. VERTEX spectrometers share a wide range of features, including an intelligent network for automation, Automatic Component Recognition (ACR), the Plug & Play Ethernet connection and Automatic Accessory Recognition (AAR). VERTEX 70v Bruker's VERTEX 70v FTIR Spectrometer is based on the well-known RockSolid™ interferometer and the ideal entry level systems for Advanced Research applications. The vacuum optics bench provides class leading specifications. VERTEX 80/80v The high-end VERTEX 80 and the VERTEX 80v vacuum FTIR spectrometers are based on the actively aligned UltraScan™ interferometer, which provides PEAK spectral resolution and highest scanning speed.

The microplate extension HTS-XT allows the application of FTIR spectroscopy as method for high-throughput screening. The acquisition, control and evaluation of spectral data from large numbers of samples are performed by the OPUS/LAB software. The HTS-XT is an external module that can be connected to different Bruker Optics FTIR spectrometers. Depending on its configuration it can be used for measurements in the mid infrared to the near infrared and even the VIS range.

The LUMOS II offers outstanding visual and spectral data quality with full automation of all measurement modes: transmission, reflection and ATR. For FTIR beginners and experts alike, the LUMOS II is the best solution for infrared microscopy. Bruker's exclusive Focal Plane Array (FPA) detector technology allows you to experience detailed imaging at the maximum speed. This allows you to take full advantage of the vast possibilities offered by FT-IR microscopy. The OPUS IR software provides you with assistance whenever you need it and allows you to glide effortlessly through measurement, evaluation and reporting. Your advantages: • Extremely fast FT-IR imaging (FPA) • High spectral quality and resolution • Brilliant visual images and huge field of view • Fully automated FT-IR microscope • Integrated, piezo-controlled ATR crystal • Software supported measurement and evaluation • Automatic measurement in transmission, reflection and ATR