RAYEX® D Dynamic X-Ray Measuring System

X-ray device for measuring wall thickness, eccentricity, diameter & ovality.

Description

RAYEX D XT is a low energy X-ray and high speed scanning system for the measurement of wall thickness, eccentricity, diameter and ovality of multilayer or single layer products in CV lines or others. RAYEXD XT is based on the worlds first system which was able to measure all relevant cable parameters from outside the tube looking through beryllium windows. The RAYEX D XT is protected under international patents CH 685 336 A5, US 5 518 681, US 5 795 531 and other rights. Properties A measuring system for measuring wall thickness, eccentricity, diameter and ovality Wall thickness testing from 0.3 mm Measuring of products between 15 mm … 140 mm Measuring of 3 layers simultaneously Unique X-ray source concept with integrated high-voltage source and micro beam guideway Unique adaptive integration solution for hot or cold measuring solutions Communication via integrated interfaces such as Ethernet IP, Profinet IO or Ethernet TCP/IP Integrated web server in all processor versions.

Domain icon Manufacturer/ Producer

2552 Orpund - Switzerland

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