Rebirth of Force Spectroscopy Advanced Nanomechanical, Electrical, Optical, Thermal and Piezoresponse Studies Fast Quantitative Nanomechanical Measurements and Force Volume Simultaneous Electrostatic and Nondestructive Conductivity, Piezoresponse and Thermal Studies Advanced CantileverType TipEnhanced Raman Scattering and Scanning NearField Optical Microscopy Topography in Attraction and Repulsive Regimes Young’s Modulus and Force Volume Adhesion and Work of Adhesion Conductivity InPlane and OutofPlane Piezoresponse Temperature and Thermal Conductivity Thermoelectric Electrostatic Kelvin Probe Force, Electrostatic Force and Scanning Capacitance Force Microscopy NearField Component of Optical Response TipEnhanced Raman Scattering In HybriD mode the tipsample distance is modulated according to the quasiharmonic law.
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Need to measure the fluorescent properties of a component with your Spectrometer but you feel like something’s missing? Maybe it’s Knight Optical range of Stock Dichroic Filters, ideal for use within Fluorescence Microscopy and Spectroscopy. For Fluorescence Microscopy and Spectroscopy, dichroic filters are used as beam splitters within the microscope system. They are used as an edge filter at a tilted angle of incidence (typically 45°) to direct the illumination of an excitation frequency towards the sample of interest, and then at an analyser to reject the same excitation frequency but passes a particular emission frequency. Dichroic filters offer superior contrast between transmitted and reflected wavelengths; having negligible absorption. Having a dielectric coating they are perfect for high power applications and they do not show the strong fluorescence of certain glass filters. For more information read the PDF
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Many materials cannot be measured tactilely, therefore non-contact thickness measurements become necessary. Especially e.g. with glowing materials, or wet processes, a continuous tactile measurement is nearly impossible. Furthermore, web speeds in plant engineering and production have increased, requiring a corresponding fast sampling rate of the measuring systems. In addition, high measuring widths are often required. Why is contact free measurement technology so perfect for this application? Can be used in any web width, Scalable measurement thicknesses from a few millimetres to several meters, Thickness and coating thickness can be measured for different materials, Vibrations of the web materials, can be compensated, Turnkey solution for mechanical engineering, Non-contact and non-destructive measurement method, Large distances to the measured object are possible, Measurement of free forms,
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The INGENERIC beamPROP is a lens array which matches the beam parameter product (BPP) of the fast and slow axis of high power diode laser arrays. The beamPROP is a key component for the 1. fiber coupling of diode bars 2. dense wavelength beam combining. Both applications make high demands on the components, which are met by INGENERIC’s outstanding manufacturing technology, guaranteeing highest levels of efficiency for diode lasers. Achieve the highest beam quality through the four major features behind the beamPROP: - complete utilization of the aperture by minimized transition zones - minimum aberrations achieved by highest level of precision and uniformity of single lenslets - an exact rotation of the emitter is achieved through the defined center thickness accuracy - minimum pointing errors due to an exact position of front and back surfaces
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