IMOS Interference Microscope-nanoprofilometer

Nanoprofilometers

Description

IMOS Interference Microscope-nanoprofilometer enables accurate, quantitative, ISOcompliant noncontact surface measurements and characterization of micro and nanoscale surface characteristics, capturing up to two million data points in seconds. Choosing the right optical profilometer depends on your application requirements, including speed, accuracy, vertical range, automation and flexibility. IMOS optical surface profilometer provides powerful versatility in noncontact optical surface measurements. The system makes it easy and fast to investigate a wide range of surface types, including smooth, rough, flat, sloped and stepped surfaces. All measurements are nondestructive, fast and require no special sample preparation.

  • Optical measuring equipment
  • nanoprofilometer
  • optical microscope
  • interference microscope

Product characteristics

XY resolution
1 µm
Measurement area
0.4 x 0.3 mm *
Pixel size in measurement area
0.3 µm *
Photodetector**
CCD-matrix 1392х1040
Light source**
LED (λeff = 630 nm)
Microobjectives**
20x (or 10x, 5x), 2 items without changing magnification
Scanner
Piezoelectric ceramic element
Sample stages
1D (Z) range 50 mm, 2D (XY) range 75x50 mm
Controllers
CCD-camera frame grabber, stages controller, device control unit
PC & Control software
Included

Documents

Domain icon Manufacturer/ Producer

121087 Moscow - Russia

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