Radio Frequency Probes

MµProbe® probe cards are characterized by MEMS contact elements and are particularly suitable for fine pitch full array applications in wafer test.

Probe card with lamella contact elements, especially suitable for RF applications with a high design variety.

Feinmetall test connectors are available for many interfaces such as RJ, USB, HDMI and others. They can be installed very easily and effectively in test fixtures and test modules.

Four-pole measurement at minimum space: coaxial contact probes with inner conductor as sense pin, from smallest pitches up to highest currents.