Ims5420-th Wafer Thickness Measuring System

Interferometers (white light)
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Description

The IMS5420 is a high-performance white light interferometer for non-contact thickness measurement of monocrystalline silicon wafers. The controller has a broadband superluminescent diode (SLED) with a wavelength range of 1,100 nm. This enables the thickness measurement of undoped, doped and highly doped SI wafers with only one measuring system. The IMS5420 achieves a signal stability of less than 1 nm. The thickness can be measured from a distance of 24 mm.

  • Sensors
  • Sensor Mechanics
  • Frame Sensors

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94496 Ortenburg - Germany

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