Contact Probes for Automotive Applications

Contacting of all common RF connectors: For frequencies up to 20 GHz, with smart design for highest reliability and easy mounting.

MµProbe® probe cards are characterized by MEMS contact elements and are particularly suitable for fine pitch full array applications in wafer test.

Probe card with lamella contact elements, especially suitable for RF applications with a high design variety.

Feinmetall test connectors are available for many interfaces such as RJ, USB, HDMI and others. They can be installed very easily and effectively in test fixtures and test modules.