NT-MDT LLC - Developer of research instrumentation and scientific equipment

Highperformance versatile AFM Optical access from top, side and bottom optimized for Raman, TERS and SNOM Flexible optical design providing any combination of excitation/collection configurations Automated AFM laser, probe and photodiode alignment Userfriendly change of wavelength of AFM registration system laser and photodiode Easy and userfriendly change of objectives Integration with IR sSNOM (optional) Since 1998 NTMDT has been successfully integrating AFM with optical microscopy and spectroscopy techniques. More than 30 basic and advanced AFM modes including HybriD ModeTM are supported providing extensive information about the sample surface physical properties. Integration of AFM with confocal Raman/fluorescence microscopy provide the widest range of additional information about the sample. Simultaneously measured AFM and Raman maps of exactly the same sample area provide complementary information about sample physical properties (AFM) and chemical composition (Raman).

IR s‑SNOM microscopy and spectroscopy with 10 nm spatial resolution Wide spectral range of operation 312 μm Incredibly low thermal drift and high signal stability Versatile AFM with advanced modes SRI (conductivity), KPFM (surface potential), SCM (capacitance), MFM (magnetic properties), PFM (piezoelectric forces) HybriD Mode™ quantitative nanomechanical mapping Integration with microRaman (optional) The ability of s‑SNOM measurements in the visible spectral range (optional) NTMDT Spectrum Instruments presents NTEGRA Nano IR scattering scanning nearfield optical microscope (s‑SNOM) designed for infrared (IR) spectral range. AFM probe is located in the focus of optical system which excites sample structure by IR laser and collects the optical response. Collected light is directed to Michelson interferometer for optical analysis.

NTEGRA is a multifunctional device for performing the most typical tasks in the field of Scanning Probe Microscopy. The device is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in highfrequency (up to 5MHz) modes. This feature appears to be principal for the work with highfrequency AFM modes and using highfrequency cantilevers.* There are several scanning types implemented in NTEGRA scanning by the sample, scanning by the probe and dualscanning. On account of that, the system is ideal for investigating small samples with ultrahigh resolution (atomicmolecular level) as well as for big samples and scanning range up to 100x100x10 µm.

Industry leading automation level Outstanding noise floor and thermal drifts Fast scanner with XYZ lownoise closeloop Routine atomic resolution 60+ SPM modes in basic configuration Continuous zoom from millimeter to nanometer range Integrated with new Atomic Force Microscopy technique HybriD Mode™ Atomic Force Microscope NEXT provides motorized sample positioning and integrated high resolution optical microscope positioning, motorized continuous zoom and focusing of the optical microscope. But AFM automation is more than just motorization. Powerful Nova PX software algorithms remove a gap between optics and AFM providing continuous zoom from huge panoramic optical view down to atomic resolution. Since all step movers are coupled together with the optical image, NEXT provides autofocus, fast oneclick cantilever alignment, panoramic optical view and multiple scanning on 5×5 mm range.Cantilever recognition and automatic laser alignment both in liquid and air Autofocus

Ultimate imaging quality with buildin acoustic and vibration isolation, active thermostabilization, industry lowest 25 fm/√Hz optical beam deflection sensor noise and unique design of scanningbytip system allow routine high resolution imaging. Equipped with 50+ AFM modes including HybriD mode all cuttingedge nanomechanical, electrical and magnetic studies are available in basic configuration. Automated study of samples arrays by userdefined scenario with database image storage. Up to 200×200 mm and 40 mm in height samples inspection in any point with 1 μm positioning accuracy. Smart ScanT™ software for oneclick optimization of scanning parameters. This is not just an algorithm, it is rather a unique companion that helps a newcomers in AFM to get industry quality images and assists the experts. Wide possibilities of customization integration of addition optical equipment

AFM holds a strong positions in scientific research as is used as a routine analytical tool for physical properties characterization with high spatial resolution down to atomic level. Solver Nano is the best choice for scientists who are need a single instrument that is an affordable, robust, userfriendly and professional tool. Solver Nano is designed by the NTMDT SI team that also created High Performance Systems like NTEGRA, NEXT II and NTEGRA Spectra II which have been proven in the scientific community through many key publications. Solver Nano is equipped with a professional 100 micron CL (closed loop XYZ) piezotube scanner with low noise capacitance sensors. Capacitance sensors in comparison with strain gauge and optical sensors have lower noise and higher speed in the feedback signal. The CL scanner is controlled by a professional workstation and software. These capabilities enable all of the basic AFM techniques in compact SPM design.

Atomic Force Microscopy is a widely used and powerful technique for investigating materials at a nanoscale range. However, the technique is not simple to use, which elicits varied results between researchers with different levels of experience. NTMDT Spectrum Instruments (formerly NTMDT) have created the intelligent software, ScanT™, inspired by neural networks to make dynamic amplitude modulation AFM (AMAFM) easy for researchers of every skill level. The AFM amplitude modulation (AM) mode, also known as “tapping” or “semicontact”, is based on dependency of cantilever amplitude oscillation on distance between sample surface and tip. This mode is often favored over other AFM modes because it provides minimal impact on the sample and the tip, which can help to preserve both.

RapidScan™ technology is a combination of mechanical design and highend digital electronical solutions which allows to speed up your AFM by an order of magnitude keeping 90 µm inplane scaninng range. All three access are equipped with highprecision closedloop capacitive sensors.

Rebirth of Force Spectroscopy Advanced Nanomechanical, Electrical, Optical, Thermal and Piezoresponse Studies Fast Quantitative Nanomechanical Measurements and Force Volume Simultaneous Electrostatic and Nondestructive Conductivity, Piezoresponse and Thermal Studies Advanced CantileverType TipEnhanced Raman Scattering and Scanning NearField Optical Microscopy Topography in Attraction and Repulsive Regimes Young’s Modulus and Force Volume Adhesion and Work of Adhesion Conductivity InPlane and OutofPlane Piezoresponse Temperature and Thermal Conductivity Thermoelectric Electrostatic Kelvin Probe Force, Electrostatic Force and Scanning Capacitance Force Microscopy NearField Component of Optical Response TipEnhanced Raman Scattering In HybriD mode the tipsample distance is modulated according to the quasiharmonic law.

Force spectroscopy is a wellknown AFM technique for quantification of local nanomechanical properties. HD mode allows fast, more than 1000 force curves per second measurements, realtime calculation of Young’s modulus according to Hertz, DMT, JKR and other mathematical models and automated cantilever force constant calibration. HybriD Mode uniquely enables stiff materials to be distinguished from each other by means of an AFM probe. Areas corresponding to Bismuth (32 GPa, blue color) and Tin (50 GPa, yellow color) are clearly identified. The mechanical properties map corresponds well with the surface potential image.