Adaptable to an enormous range of applications, the ViProbe® is a proven buckling beam technology for more than 25 years, valued above all for its uniquely easy reparability.
Germany
New version of vertical contact technology with focus on increased service life and other advantages.
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Contacting of all common RF connectors: For frequencies up to 20 GHz, with smart design for highest reliability and easy mounting.
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MµProbe® probe cards are characterized by MEMS contact elements and are particularly suitable for fine pitch full array applications in wafer test.
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Probe card with lamella contact elements, especially suitable for RF applications with a high design variety.
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